This webinar will detail how ATONARP enables Aston to increase factory throughput and deliver in-situ metrology solutions for advanced CVD and etch applications. The presentation will detail Aston's ability to meet metrology challenges and compare Aston's robust in-situ molecular sensor technology (including integrated plasma ionization sources) to existing legacy metrology solutions. For more information and to access additional resources, please visit http://atonarp.com/aston.

This webinar discussion will be led by Saïd Boumsellek, PhD, Sr. Saïd holds a PhD in Physics and is the Director of Instrumentation & Applications at Atonarp, He has published more than 32 papers in peer-reviewed journals and more than 40 patents in the fields of ionization sources and chemical analysis techniques.

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The webinar is hosted by SemiWiki.

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