NEWS NEWS
Semiconductor Digest｜Video Interview with Joe Cestari of Atonarp
Pete Singer, Editor-in-Chief of Semiconductor Digest, recently interviewed Joe Cestari, Mass Spectrometry GM at Atonarp.
In the video, Joe explains the advantages of Atonarp's Aston mini mass spectrometer over traditional in-situ chamber analysis methods such as optical emission spectrometry (OES) and residual gas analysis (RGA).
Aston enables real-time in-situ monitoring of precursors, reactants, and by-products during various process steps, and provides baseline fingerprinting, chamber cleaning, and process monitoring endpoints.
Aston unit with robust plasma ionization source and regen mode with self-cleaning function.
Watch the interview
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